In Situ Characterization of Fabry-Pérot Microcavities for Coupling to NV Centres in Diamond

Download or read book In Situ Characterization of Fabry-Pérot Microcavities for Coupling to NV Centres in Diamond written by Cesar Daniel Rodriguez Rosenblueth and published by . This book was released on 2021 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: "The nitrogen-vacancy (NV) centre in diamond is one of the most prominent diamond defect centres studied for quantum information applications. The NV centre’s long coherence times and atom-like spin-optical properties have made it one of the possible candidates for a node in a quantum network. Recent achievements include their use as a ten qubit solid-state quantum register, and the first loophole-free Bell experiment separated at km-scale distances. However, current implementations of the NV centre in cavity quantum electrodynamic (cQED) protocols are restricted due to its low emission rate (3%) into its coherent zero-phonon line (ZPL) transition as well as spectral diffusion originating from electric field noise on nearby surfaces. Coupling NV centres in diamond membranes to open Fabry-Pérot fibre microcavities offers one possible solution by enhancing the emission rate into the (ZPL) without degrading the NV centre’s optical properties.The work in this thesis is concerned with the in-situ characterization of the Fabry-Pérot cavities. By adequately characterizing the membrane-in-cavity system in situ, we hope to pave the way to maximize the achievable enhancement of the zero-phonon line emission rate of an NV centre inside the cavity. We study analytical and numerical models for the membrane-in-cavity system and analyze their regime of validity. By combining these models with transmission and reflection characterization of the system we determine the diamond thickness and length of the cavity with a resolution of 100 nm. The cavity finesse ranges between 16000 to 26000, depending on the presence of the diamond membrane and mirror termination. Finally, we expand upon the previously presented models to include surface losses and achieve a method to measure (sub-nm-rms) surface roughness and (ppm) mirror losses by measuring the cavity linewidth as a function of wavelength"--