Related Books
Language: en
Pages: 303
Pages: 303
Type: BOOK - Published: 2000 - Publisher: World Scientific
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques
Language: en
Pages: 303
Pages: 303
Type: BOOK - Published: 2000-10-27 - Publisher: World Scientific
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques
Language: en
Pages: 315
Pages: 315
Type: BOOK - Published: 2003-07-07 - Publisher: World Scientific
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations ca
Language: en
Pages: 510
Pages: 510
Type: BOOK - Published: 2015 - Publisher: World Scientific
This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles an
Language: en
Pages: 432
Pages: 432
Type: BOOK - Published: 2004-08-27 - Publisher: Springer Science & Business Media
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industr