X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting resea

"This book aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings"--

Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a de

Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of m