Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are

Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-elec

It is proposed in this thesis that a measure to determine the electrical overstress (EOS) hardness of integrated circuits with respect to EOS/electrostatic disc

This book will provide a broad but detailed view of Electrical Overstress in semiconductor devices, with a focus on integrated circuit and discrete devices. It