A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.

A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of th

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussio

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus