Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. Th

Detailed enough to serve as both text and reference, this volume addresses topics vital to understanding high-power accelerators and high-brightness-charged par

Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said confe

This authoritative text offers a unified, programmed summary of the principles underlying all charged particle accelerators — it also doubles as a reference c