Characterisation and Control of Defects in Semiconductors

Download or read book Characterisation and Control of Defects in Semiconductors written by Filip Tuomisto and published by Institution of Engineering and Technology. This book was released on 2019-10-21 with total page 601 pages. Available in PDF, EPUB and Kindle. Book excerpt: Understanding the formation and introduction mechanisms of defects in semiconductors is essential to understanding their properties. Although many defect-related problems have been identified and solved over the past 60 years of semiconductor research, the quest for faster, cheaper, lower power, and new kinds of electronics generates an ongoing need for new materials and properties, and so creates new defect-related challenges.