This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo

Today’s manufacturing systems are undergoing significant changes in the aspects of planning, production execution, and delivery. It is imperative to stay up-t

This volume features the refereed proceedings of the 17th International Workshop on Power and Timing Modeling, Optimization and Simulation. Papers cover high le

Reliability concerns and the limitations of process technology can sometimes restrict the innovation process involved in designing nano-scale analog circuits. T

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as sta