X-ray Scattering from Semiconductors
| Author | : Paul F. Fewster |
| Publisher | : World Scientific |
| Total Pages | : 303 |
| Release | : 2000 |
| ISBN-10 | : 9781860941597 |
| ISBN-13 | : 1860941591 |
| Rating | : 4/5 (591 Downloads) |
Book Synopsis X-ray Scattering from Semiconductors by : Paul F. Fewster
Download or read book X-ray Scattering from Semiconductors written by Paul F. Fewster and published by World Scientific. This book was released on 2000 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.