References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology .

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there

For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The sta

In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care fully. The problem

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly