Related Books

Characterization and Metrology for ULSI Technology: 2003
Language: en
Pages: 868
Authors: David G. Seiler
Categories: Computers
Type: BOOK - Published: 2003-10-08 - Publisher: American Institute of Physics

DOWNLOAD EBOOK

The worldwide semiconductor community faces increasingly difficult challenges as it moves into the manufacturing of chips with feature sizes approaching 100 nm
Istfa 2003
Language: en
Pages: 534
Authors: ASM International
Categories: Technology & Engineering
Type: BOOK - Published: 2003-01-01 - Publisher: ASM International

DOWNLOAD EBOOK

Characterization and Metrology for ULSI Technology 2005
Language: en
Pages: 714
Authors: David G. Seiler
Categories: Computers
Type: BOOK - Published: 2005-09-29 - Publisher: American Institute of Physics

DOWNLOAD EBOOK

The worldwide semiconductor community faces increasingly difficult challenges in the era of silicon nanotechnology and beyond. The magnitude of these challenges
Characterization and Metrology for ULSI Technology, 2000
Language: en
Pages: 734
Authors: David G. Seiler
Categories: Integrated circuits
Type: BOOK - Published: 2001 - Publisher:

DOWNLOAD EBOOK

Semiconductor Material and Device Characterization
Language: en
Pages: 800
Authors: Dieter K. Schroder
Categories: Technology & Engineering
Type: BOOK - Published: 2015-06-29 - Publisher: John Wiley & Sons

DOWNLOAD EBOOK

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characteri